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Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS

Published online by Cambridge University Press:  30 July 2020

Ho Leung Chan ,
Matthew Mecklenburg ,
William Hubbard ,
Jared Lodico ,
Brian Zutter  and
B. C. Regan
Ho Leung Chan
Affiliation:
University of California, Los Angeles, Los Angeles, California, United States
Matthew Mecklenburg
Affiliation:
University of Southern California, Los Angeles, California, United States
William Hubbard
Affiliation:
NanoElectroning Imaging, Inc. (NEI), Los Angeles, California, United States
Jared Lodico
Affiliation:
University of California, Los Angeles, Los Angeles, California, United States
Brian Zutter
Affiliation:
University of California, Los Angeles, Los Angeles, California, United States
B. C. Regan
Affiliation:
Department of Physics & Astronomy, University of California-Los Angeles, Los Angeles, California, United States

Abstract

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Type
Approaching Operando Imaging of Functional Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 904 - 905
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Copyright
Copyright © Microscopy Society of America 2020

References

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This work was supported by SRC NMP 2872.001, NSF STC award DMR-1548924 (STROBE), and NSF award DMR-1611036. Data presented here were acquired at the Core Center of Excellence in Nano Imaging (CNI) at the University of Southern California.Google Scholar