Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-13T00:59:12.552Z Has data issue: false hasContentIssue false
  • English
  • Français

Focused Electron-Beam Induced Deposition, In Situ TEM And Off-Axis Electron Holography Investigation of Bi-Magnetic Core-Shell Nanostructures

Published online by Cambridge University Press:  05 August 2019

Trevor P. Almeida ,
Damien McGrouther ,
András Kovács ,
Rafal E. Dunin-Borkowski  and
Stephen McVitie
Trevor P. Almeida*
Affiliation:
SUPA, School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK.
Damien McGrouther
Affiliation:
SUPA, School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK.
András Kovács
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany
Rafal E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany
Stephen McVitie
Affiliation:
SUPA, School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 56 - 57
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Lavorato, G. C., et al. , J. Alloys Compd. 633, 333–337 (2015).Google Scholar
[2]Lee, J-H., et al. , Nat. Nanotechnol. 6, 418-422 (2011).Google Scholar
[3]De Teresa, J.M, et al. , J. Phys. D: Appl. Phys. 49, 243003 (2016).Google Scholar
[4]Almeida, T. P., et al. , Sci. Adv., 2, e1501801 (2016).Google Scholar
[5]Almeida, T. P., et al. , Geophys. Res. Lett., 43, 8426-8434 (2016).Google Scholar
[6]Hӱtch, M. J., et al. , Phys. Rev. Lett., 91, 257207, 2003.Google Scholar