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Focused Ion Beam Characterization of Low Melting Point Metals at Cryogenic Temperatures

Published online by Cambridge University Press:  22 July 2022

Daniel L. Perry ,
Damion P. Cummings ,
Jeremy A. Walraven ,
Matthew B. Jordan ,
Joseph R. Michael  and
Julia I. Deitz
Daniel L. Perry*
Affiliation:
Sandia National Laboratories, Albuquerque, NM, United States
Damion P. Cummings
Affiliation:
Sandia National Laboratories, Albuquerque, NM, United States
Jeremy A. Walraven
Affiliation:
Sandia National Laboratories, Albuquerque, NM, United States
Matthew B. Jordan
Affiliation:
Sandia National Laboratories, Albuquerque, NM, United States
Joseph R. Michael
Affiliation:
Sandia National Laboratories, Albuquerque, NM, United States
Julia I. Deitz
Affiliation:
Sandia National Laboratories, Albuquerque, NM, United States
*
*Corresponding author: dlperry@sandia.gov

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 78 - 79
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Copyright
Copyright © Microscopy Society of America 2022

References

de Morais, LD, Chevalliez, S and Mouleres, S, Microelec. Reliability 54 (2014), p. 1802.10.1016/j.microrel.2014.08.004CrossRefGoogle Scholar
Nelson, RS, Philosophical Magazine 11(110) (1965), p. 291.10.1080/14786436508221857CrossRefGoogle Scholar
This work is supported by the Laboratory Directed Research and Development program at Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA0003525. This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government.Google Scholar