We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Pobell, F., Matter and methods at low temperatures, Vol. 2, Springer, 2007CrossRefGoogle Scholar
[2]
Fernandez-Pacheco, A., De Teresa, J., Cordoba, R., Ibarra, M., Metal-insulator transition in pt-c nanowires grown by focused-ion-beam-induced deposition, Physical Review B79 (17) 174204 (2009).CrossRefGoogle Scholar
[3]
Beloborodov, I., Lopatin, A., Vinokur, V., Efetov, K., Granular electronic systems, Reviews of Modern Physics79 (2) 469 (2007)Google Scholar