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Focused Ion Beam (FIB) based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)

Published online by Cambridge University Press:  04 August 2017

S. Balachandran ,
Z. Radha ,
D. Colbry  and
M.A. Crimp
S. Balachandran
Affiliation:
Department of Chemical Engineering and Materials Science, Michigan State University, East Lansing, USA
Z. Radha
Affiliation:
Department of Computer Science and Engineering, University of Michigan, Ann Arbor, USA
D. Colbry
Affiliation:
Department of Computational Mathematics, Science and Engineering, Michigan State University, East Lansing, USA
M.A. Crimp
Affiliation:
Department of Chemical Engineering and Materials Science, Michigan State University, East Lansing, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 572 - 573
Copyright
© Microscopy Society of America 2017 

References

[1] Crimp, M.A. Microscopy Research and Technique 69 2006). p. 374.Google Scholar
[2] Yamasaki, S., et al, Scripta Materialia 10(1 2015). p. 80.Google Scholar
[3] Kerns, R.D., Balachandran, S., Hunter, A.H. & Crimp, M.A. (Unpublished Research).Google Scholar
[4] Dluhos, J., Sedlac ek, L. & Man, J. Proceedings of the 21st International Conference on Metallurgy and Materials, Brno, Czech Republic, EU, 2012.Google Scholar