Hostname: page-component-cd9895bd7-fscjk Total loading time: 0 Render date: 2024-12-29T06:31:31.277Z Has data issue: false hasContentIssue false

Focused-probe STEM Ptychography: Developments and Opportunities

Published online by Cambridge University Press:  30 July 2020

Colum O'Leary
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Emanuela Liberti
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Gerardo Martinez
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Christopher Allen
Affiliation:
Electron Physical Science Imaging Centre, Diamond Light Source, Didcot, England, United Kingdom
Chen Huang
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Mathias Rothmann
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Hui Luo
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Judy Kim
Affiliation:
Electron Physical Science Imaging Centre, Diamond Light Source, Didcot, England, United Kingdom
Laura Herz
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Hazel Assender
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Lewys Jones
Affiliation:
Trinity College Dublin, Dublin, Dublin, Ireland
Angus Kirkland
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Peter Nellist
Affiliation:
University of Oxford, Oxford, England, United Kingdom

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Copyright
Copyright © Microscopy Society of America 2020

References

Ophus, C., Microscopy and Microanalysis, vol. 25, no. 3, pp. 563582, 2019.10.1017/S1431927619000497CrossRefGoogle Scholar
Lozano, J. G. et al. , Nano Lett., vol. 18, no. 11, pp. 68506855, 2018.10.1021/acs.nanolett.8b02718CrossRefGoogle Scholar
Pennycook, T. J., et al. , Ultramicroscopy, vol. 151, pp. 160167, 2015.10.1016/j.ultramic.2014.09.013CrossRefGoogle Scholar
Huth, M., et al. , Microscopy and Microanalysis, vol. 25, no. S2, pp. 4041, 2019.10.1017/S143192761900093XCrossRefGoogle Scholar
O'Leary, C. M et al. , Microscopy and Microanalysis vol. 25, no. S2, pp. 16621663, 2019.10.1017/S1431927619009048CrossRefGoogle Scholar
Jones, L. et al. , Advanced Structural and Chemical Imaging, vol. 1, no. 8, 2015.10.1186/s40679-015-0008-4CrossRefGoogle Scholar
Ciston, J., et al., Microscopy and Microanalysis, vol. 25, no. S2, pp. 19301931, 2019.10.1017/S1431927619010389CrossRefGoogle Scholar
The financial support of the EPSRC, The Henry Royce Institute and JEOL (UK) Ltd. Is gratefully acknowledged. We thank Diamond Light Source for access and support in use of the electron Physical Sciences Imaging Centre (Instrument E02, proposal numbers MG20431 and MG22317) that contributed to the results presented here.Google Scholar