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Following the Electrons: Simulation for High-Resolution STEM and CBED

Published online by Cambridge University Press:  05 August 2019

Mark P. Oxley
Mark P. Oxley*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA. Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
*
*Corresponding author: oxleymp@ornl.gov

Abstract

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Type
Following the Electrons: Simulation for High-Resolution STEM and CBEDs
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2680 - 2681
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Loane, RF, Xu, P and Silcox, J, Acta. Cryst. A 47 (1991), p. 267.Google Scholar
[2]Forbes, BD, Martin, AV, Findlay, SD, D'Alfonso, AJ and Allen, LJ, Phys. Rev. B 82, (2010), 104103.Google Scholar
[3]Allen, LJ, D'Alfonso, AJ and Findlay, SD, Ultramicroscopy 151 (2015), p. 11.Google Scholar
[4]Research supported by the U.S. Department of Energy, Office of Basic Energy Sciences, Materials Sciences and Engineering Division.Google Scholar