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Functionalized Holders for 3D S/TEM Imaging and Analysis of Nanoparticles

Published online by Cambridge University Press:  31 July 2006

K Jarausch
Affiliation:
Hitachi High Technologies
D Leonard
Affiliation:
North Carolina State University
T Kamino
Affiliation:
Hitachi High Technologies

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Copyright
© 2006 Microscopy Society of America