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G-mode - Full Information Capture Applied to Scanning Probe Microscopy

Published online by Cambridge University Press:  04 August 2017

Suhas Somnath ,
Sergei V. Kalinin  and
Stephen Jesse
Suhas Somnath
Affiliation:
The Institute of Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA. The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA.
Sergei V. Kalinin
Affiliation:
The Institute of Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA. The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA.
Stephen Jesse
Affiliation:
The Institute of Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA. The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 184 - 185
Copyright
© Microscopy Society of America 2017 

References

[1] Balke, N., et al, Journal of the American Ceramic Society 92 2009). p. 1629.Google Scholar
[2] Jesse, S., et al, Rev Sci Instrum 77 2006). p. 073702.Google Scholar
[3] This research was conducted at the Center for Nanophase Materials Sciences, which is a DOE office of Science User Facility.Google Scholar