Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-27T21:35:35.124Z Has data issue: false hasContentIssue false
  • English
  • Français

Hardware and Software Advances in Commercially Available Atom Probe Tomography Systems

Published online by Cambridge University Press:  04 August 2017

Robert M. Ulfig ,
Ty J. Prosa ,
Yimeng Chen ,
Katherine P. Rice ,
Isabelle. Martin ,
David A. Reinhard ,
Brian P. Gieser ,
Edward Oltman ,
Dan R. Lenz  and
Joseph Bunton
...Show all authors
Robert M. Ulfig
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Ty J. Prosa
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Yimeng Chen
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Katherine P. Rice
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Isabelle. Martin
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
David A. Reinhard
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Brian P. Gieser
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Edward Oltman
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Dan R. Lenz
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Joseph Bunton
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Michael Van Dyke
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
Thomas F. Kelly
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.
David J. Larson
Affiliation:
CAMECA Instruments, Inc., 5470 Nobel Drive, Madison, WI, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 40 - 41
Copyright
© Microscopy Society of America 2017 

References

[1] Larson, D.J., et al, Local Electrode Atom Probe Tomography. Springer New York 2013.Google Scholar
[2] Rice, K.P., et al, Microscopy and Microanalysis 22(3 2016). p 583.Google Scholar
[3] Vurpillot, F., et al, Semiconductor Science and Technology 31(7 2016). p 074002.Google Scholar
[4] Geiser, B., et al These Proceedings (2017).Google Scholar