Hostname: page-component-78c5997874-8bhkd Total loading time: 0 Render date: 2024-11-14T06:36:14.869Z Has data issue: false hasContentIssue false
  • English
  • Français

High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors

Published online by Cambridge University Press:  23 September 2015

Arantxa Vilalta-Clemente ,
G. Naresh-Kumar ,
M. Nouf-Allehiani ,
Peter J. Parbrook ,
Emmanuel D.Le Boulbar ,
Duncan Allsopp ,
Philip A. Shields ,
Carol Trager-Cowan  and
Angus J. Wilkinson
Arantxa Vilalta-Clemente
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.
G. Naresh-Kumar
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow G4 0NG, United Kingdom.
M. Nouf-Allehiani
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow G4 0NG, United Kingdom.
Peter J. Parbrook
Affiliation:
Tyndall National Institute, University College Cork, "Lee Maltings", Cork, Ireland.
Emmanuel D.Le Boulbar
Affiliation:
Department of Electronic and Electrical Engineering, University of Bath, Bath BA2 7AY, United Kingdom.
Duncan Allsopp
Affiliation:
Department of Electronic and Electrical Engineering, University of Bath, Bath BA2 7AY, United Kingdom.
Philip A. Shields
Affiliation:
Department of Electronic and Electrical Engineering, University of Bath, Bath BA2 7AY, United Kingdom.
Carol Trager-Cowan
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow G4 0NG, United Kingdom.
Angus J. Wilkinson
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2217 - 2218
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Wilkinson, A J & Britton, T. B., Materials Today 15 (2012). p. 366.Google Scholar
[2] Wilkinson, A J, et al, Ultramicroscopy 106 (2006). p. 307.CrossRefGoogle Scholar
[3] Naresh-Kumar, G, et al, Phys. Rev. Lett. 108 (2012). p. 135503.Google Scholar
[4] The authors acknowledge funding from EPSRC grant No: EP/J015792/1 & EP/J016098/1.Google Scholar