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Improving Sensitivity and Productivity with High count rate X-ray spectrum images

Published online by Cambridge University Press:  04 August 2017

Simon Burgess ,
Matthew Hiscock  and
Philippe Pinard
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
Matthew Hiscock
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 46 - 47
Copyright
© Microscopy Society of America 2017