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In Situ Atom Probe Deintercalation of Lithium-Manganese-Oxide

Published online by Cambridge University Press:  30 January 2017

Björn Pfeiffer ,
Johannes Maier ,
Jonas Arlt  and
Carsten Nowak
Björn Pfeiffer*
Affiliation:
Institute of Materials Physics, Georg-August-University Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
Johannes Maier
Affiliation:
Institute of Materials Physics, Georg-August-University Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
Jonas Arlt
Affiliation:
Institute of Materials Physics, Georg-August-University Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
Carsten Nowak
Affiliation:
Institute of Materials Physics, Georg-August-University Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
*
*Corresponding author.bpfeiffer@ump.gwdg.de
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Abstract

Atom probe tomography is routinely used for the characterization of materials microstructures, usually assuming that the microstructure is unaltered by the analysis. When analyzing ionic conductors, however, gradients in the chemical potential and the electric field penetrating dielectric atom probe specimens can cause significant ionic mobility. Although ionic mobility is undesirable when aiming for materials characterization, it offers a strategy to manipulate materials directly in situ in the atom probe. Here, we present experimental results on the analysis of the ionic conductor lithium-manganese-oxide with different atom probe techniques. We demonstrate that, at a temperature of 30 K, characterization of the materials microstructure is possible without measurable Li mobility. Also, we show that at 298 K the material can be deintercalated, in situ in the atom probe, without changing the manganese-oxide host structure. Combining in situ atom probe deintercalation and subsequent conventional characterization, we demonstrate a new methodological approach to study ionic conductors even in early stages of deintercalation.

Keywords

atom probeionic conductorin situ deintercalationlithium-manganese-oxidemicrostructure
Type
New Approaches and Correlative Microscopy
Information
Microscopy and Microanalysis , Volume 23 , Special Issue 2: Atom Probe Tomography & Microscopy 2016 , April 2017 , pp. 314 - 320
Copyright
© Microscopy Society of America 2017 

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