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In Situ TEM Characterization of Electrochemical Systems

Published online by Cambridge University Press:  08 April 2017

K Noh ,
L Sun ,
X Chen ,
J Wen  and
S Dillon
K Noh
Affiliation:
University of Illinois, Urbana-Champaign
L Sun
Affiliation:
Massachusetts Institute of Technology
X Chen
Affiliation:
University of Illinois, Urbana-Champaign
J Wen
Affiliation:
University of Illinois, Urbana-Champaign
S Dillon
Affiliation:
University of Illinois, Urbana-Champaign

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1572 - 1573
Copyright
Copyright © Microscopy Society of America 2011