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In situ Transmission Electron Microscopy Study of Dislocation Emission At Junctions Between Σ=3 Grain Boundaries In Gold Thin Films

Published online by Cambridge University Press:  01 August 2002

G. Lucadamo  and
D.L. Medlin
G. Lucadamo
Affiliation:
Thin Film and Interface Science Dept., Sandia National Laboratories, Livermore, CA 94551
D.L. Medlin
Affiliation:
Thin Film and Interface Science Dept., Sandia National Laboratories, Livermore, CA 94551

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1402 - 1403
Copyright
Copyright © Microscopy Society of America 2002