Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-10T06:15:33.635Z Has data issue: false hasContentIssue false
  • English
  • Français

Information theory based crystallographic symmetry classifications of a noisy 2D periodic scanning tunneling microscope image

Published online by Cambridge University Press:  05 August 2019

Peter Moeck ,
Andrew Dempsey  and
Connor Shu
Peter Moeck
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR 97207-0751
Andrew Dempsey
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR 97207-0751
Connor Shu
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR 97207-0751

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 184 - 185
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Moeck, P., Proc. 11th IEEE Intern. Conf. on Nanotechnology, Portland, August 15-18, 2011, pp. 520–525.Google Scholar
[2]Straton, J. C. et al. , Advanced Structural and Chemical Imaging 1 (2015) paper 14 (12 pages).Google Scholar
[3]Moeck, P., In: Microscopy Book Series No. 7, pp. 503–514, 2017, http://www.microscopy7.org/book/ 503–514.pdf.Google Scholar
[4]Moeck, P., Symmetry 10 (2018) paper 133 (46 pages), open access.Google Scholar
[5]Moeck, P., arXiv:1902.04155, April 2019 (23 pages).Google Scholar
[6]Vasudevan, R. K. et al. , npj Computational Materials 30 (2018) 1–9.Google Scholar
[7]Vasudevan, R. K., private communication, the STM image is freely available as support material of [6].Google Scholar
[8]Moeck, P. and DeStefano, P., Advanced Structural and Chemical Imaging 4 (2018), paper 5 (33 pages).Google Scholar
[9]Kanatani, K., Intern. J. Computer Vision 26 (1998) 171–189.Google Scholar
[10]Moeck, P. and Dempsey, A., this conference proceedings.Google Scholar