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In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope

Published online by Cambridge University Press:  05 August 2019

Toshiaki Tanigaki ,
Tetsuya Akashi ,
Takaho Yoshida ,
Ken Harada ,
Kazuo Ishizuka ,
Masahiko Ichimura ,
Yasukazu Murakami ,
Kazutaka Mitsuishi ,
Yasuhide Tomioka  and
Daisuke Shindo
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Toshiaki Tanigaki*
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan.
Tetsuya Akashi
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan.
Takaho Yoshida
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan.
Ken Harada
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan.
Kazuo Ishizuka
Affiliation:
HREM Research Inc., Matsukazedai, Japan.
Masahiko Ichimura
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan.
Yasukazu Murakami
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan. Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka, Japan.
Kazutaka Mitsuishi
Affiliation:
National Institute for Materials Science, Tsukuba, Japan.
Yasuhide Tomioka
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan.
Daisuke Shindo
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan.
Xiuzhen Yu
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan.
Yoshinori Tokura
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako, Japan. Department of Applied Physics, The University of Tokyo, Tokyo, Japan.
Hiroyuki Shinada
Affiliation:
Research & Development Group, Hitachi, Ltd., Hatoyama, Japan.
*
*Corresponding author: toshiaki.tanigaki.mv@hitachi.com

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 54 - 55
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Akashi, T. et al. , Appl. Phys. Lett. 106 (2015), p. 074101.Google Scholar
[2]Tanigaki, T. et al. , Adv. Imaging Electron Phys. 198 (2016), p. 69.Google Scholar
[3]Tanigaki, T. et al. , Sci. Rep. 7 (2017), p. 16598.Google Scholar
[4]Tomioka, Y. et al. , Phys. Rev. B 61 (2000) p. 442.Google Scholar
[5]Takai, Y. et al. , J. Electron Microsc. 47 (1998) p. 419.Google Scholar
[6]Development of the 1.2-MV holography electron microscope was supported by a grant from the Japan Society for the Promotion of Science (JSPS) through the “Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST Program)” initiated by the Council for Science, Technology, and Innovation (CSTI). Part of this research was supported by JST CREST Grant Number JPMJCR1664, Japan.Google Scholar