Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-27T22:21:39.220Z Has data issue: false hasContentIssue false
  • English
  • Français

Large Area 3D Structural Characterization by Serial Sectioning Using Broad Ion Beam Argon Ion Milling

Published online by Cambridge University Press:  04 August 2017

P. Nowakowski ,
M.L. Ray  and
P.E. Fischione
P. Nowakowski
Affiliation:
E. A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA, USA
M.L. Ray
Affiliation:
E. A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA, USA
P.E. Fischione
Affiliation:
E. A. Fischione Instruments, Inc., 9003 Corporate Circle, Export, PA, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 12 - 13
Copyright
© Microscopy Society of America 2017 

References

[1] Zaefferer, S & Wright, SI in Electron backscatter diffraction in materials science (eds. AJ Schwartzet al Springer Bostonp. 109.Google Scholar
[2] Birosca, S, et al, Acta Mater. 59 2011). p. 1510.Google Scholar
[3] Zaefferer, S, Wright, SI & Raabe, D Metall. Mater. Trans. 39 2008). p. 374.Google Scholar
[4] Khorashadizadeh, A, et al, Adv. Eng. Mater. 13 2011). p. 237.Google Scholar
[5] Burnett, TL, et al, Ultramicroscopy 161 2016). p. 119.Google Scholar
[6] Saowadee, N, Agersted, K & Bowen, JR Jour. Microsc. (Oxford, U.K.) 246 2012). p. 279.Google Scholar
[7] Lin, FX, et al, Mat. Charact 61 2010). p. 1203.Google Scholar
[8] Nowakowski, P, et al, Microsc. Microanal. 22 2016). p. 12.Google Scholar
[9] Nowakowski, P, et al, European Microscopy Congress Proceedings 2016). p. 1082.Google Scholar