Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-28T18:23:54.008Z Has data issue: false hasContentIssue false

Large-scale Automated Analysis of High-Resolution Transmission Electron Microscopy Data Assisted by Deep Learning Neural Networks

Published online by Cambridge University Press:  22 July 2022

Matthew Helmi Leth Larsen*
Affiliation:
DTU Physics, Technical University of Denmark, Kgs. Lyngby, Denmark
Cuauhtémoc Nuñez Valencia
Affiliation:
DTU Physics, Technical University of Denmark, Kgs. Lyngby, Denmark
William Bang Lomholdt
Affiliation:
DTU Nanolab, Technical University of Denmark, Kgs. Lyngby, Denmark
Daniel Kelly
Affiliation:
DTU Nanolab, Technical University of Denmark, Kgs. Lyngby, Denmark
Pei Liu
Affiliation:
DTU Nanolab, Technical University of Denmark, Kgs. Lyngby, Denmark
Jakob Birkedal Wagner
Affiliation:
DTU Nanolab, Technical University of Denmark, Kgs. Lyngby, Denmark
Ole Winther
Affiliation:
DTU Compute, Technical University of Denmark, Kgs. Lyngby, Denmark
Thomas Willum Hansen
Affiliation:
DTU Nanolab, Technical University of Denmark, Kgs. Lyngby, Denmark
Jakob Schiøtz
Affiliation:
DTU Physics, Technical University of Denmark, Kgs. Lyngby, Denmark
*
*Corresponding author: mhlla@dtu.dk

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
Copyright
Copyright © Microscopy Society of America 2022

References

Madsen, J et al. , Adv. Theory Simul. 1(8) (2018), p. 1800037, doi:10.1002/adts.201800037CrossRefGoogle Scholar
Ronneberger, O et al. , Lecture Notes in Computer Science (Including Subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) 9351 (2015), p. 234, doi:10.1007/978-3-319-24574-4_28Google Scholar
Pelt, DM and Sethian, JA, PNAS of the United States of America 115 (2018), p. 254. doi: 10.1073/pnas.1715832114Google Scholar