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Leveraging Single Atom Dynamics to Measure the Electron-Beam-Induced Force and Atomic Potentials

Published online by Cambridge University Press:  01 August 2018

Ondrej Dyck ,
Feng Bao ,
Maxim Ziatdinov ,
Ali Yousefzadi Nobakht ,
Seungha Shin ,
Kody Law ,
Artem Maksov ,
Bobby G. Sumpter ,
Richard Archibald  and
Stephen Jesse
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Ondrej Dyck
Affiliation:
The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Feng Bao
Affiliation:
Department of Mathematics, The University of Tennessee at Chattanooga, Chattanooga, TN, USA
Maxim Ziatdinov
Affiliation:
The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Ali Yousefzadi Nobakht
Affiliation:
Department of Mechanical, Aerospace, and Biomedical Engineering, the University of Tennessee, Knoxville, TN, USA
Seungha Shin
Affiliation:
Department of Mechanical, Aerospace, and Biomedical Engineering, the University of Tennessee, Knoxville, TN, USA
Kody Law
Affiliation:
Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA School of Mathematics, University of Manchester, Manchester, UK
Artem Maksov
Affiliation:
The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA Bredesen Center for Interdisciplinary Research, University of Tennessee, Knoxville, TN, USA
Bobby G. Sumpter
Affiliation:
The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Richard Archibald
Affiliation:
The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Stephen Jesse
Affiliation:
The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Sergei V. Kalinin
Affiliation:
The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 96 - 97
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Jiang, N., et al, MRS Bulletin. 42 2017) p 653–659.Google Scholar
[2] Kalinin, S.V. Pennycook, S.J. MRS Bulletin. 42 2017) p 637–643.Google Scholar
[3] Zhao, X., et al, MRS Bulletin. 42 2017) p 667–676.Google Scholar