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Live, Video-Rate Super-Resolution Microscopy Using Structured Illumination and Rapid GPU-Based Parallel Processing

Published online by Cambridge University Press:  09 March 2011

Jonathan Lefman
Affiliation:
TheNational Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA Oncogenomics Section, Pediatric Oncology Branch, Advanced Technology Center, National Cancer Institute, National Institutes of Health, Gaithersburg, MD, USA
Keana Scott
Affiliation:
TheNational Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
Stephan Stranick*
Affiliation:
TheNational Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
*
Corresponding author. E-mail: stranick@nist.gov
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Abstract

Structured illumination fluorescence microscopy is a powerful super-resolution method that is capable of achieving a resolution below 100 nm. Each super-resolution image is computationally constructed from a set of differentially illuminated images. However, real-time application of structured illumination microscopy (SIM) has generally been limited due to the computational overhead needed to generate super-resolution images. Here, we have developed a real-time SIM system that incorporates graphic processing unit (GPU) based in-line parallel processing of raw/differentially illuminated images. By using GPU processing, the system has achieved a 90-fold increase in processing speed compared to performing equivalent operations on a multiprocessor computer—the total throughput of the system is limited by data acquisition speed, but not by image processing. Overall, more than 350 raw images (16-bit depth, 512 × 512 pixels) can be processed per second, resulting in a maximum frame rate of 39 super-resolution images per second. This ultrafast processing capability is used to provide immediate feedback of super-resolution images for real-time display. These developments are increasing the potential for sophisticated super-resolution imaging applications.

Type
Biological Applications
Copyright
Copyright © Microscopy Society of America 2011

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Footnotes

Certain commercial equipment, instruments, or materials are identified in this document. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the products identified are necessarily the best available for the purpose.

References

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Lefman Supplementary Material

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