No CrossRef data available.
Article contents
Local Phase Curvature Measurement in STEM With a Pixelated Detector
Published online by Cambridge University Press: 05 August 2019
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Advances in Phase Retrieval Microscopy
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
Footnotes
†
Current address Quantum Detectors ltd, Harwell Oxford OX11 0QX, UK
References
[6]Quantum Detectors, https://quantumdetectors.com/n/products/merlinem/ (accessed Feb 13, 2019).Google Scholar
[9]The authors acknowledge ARC grant DP150104483, Core 2 Core UK/Japan EPSRC grant EP/M024412/1. Authors are also grateful for Ni80Fe20 sample made by Azzawi Sinan and Del Atkinson from University of Durham, UK.Google Scholar
You have
Access