Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-29T11:02:42.766Z Has data issue: false hasContentIssue false
  • English
  • Français

Maximizing the Information Content in Electron Microscopy Images

Published online by Cambridge University Press:  03 December 2021

Raphael Marchand  and
Thomas Juffmann
Raphael Marchand
Affiliation:
University of Vienna, Faculty of Physics, VCQ, A-1090Vienna, Austria. University of Vienna, Max Perutz Laboratories, Department of Structural and Computational Biology, A-1030Vienna, Austria.
Thomas Juffmann
Affiliation:
University of Vienna, Faculty of Physics, VCQ, A-1090Vienna, Austria. University of Vienna, Max Perutz Laboratories, Department of Structural and Computational Biology, A-1030Vienna, Austria.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
TEM Innovations to Study Materials Properties In Situ
Information
Microscopy and Microanalysis , Volume 27 , Supplement S2: Proceedings of CISCEM 2021 - the 5th Conference on In-Situ and Correlative Electron Microscopy , November 2021 , pp. 63 - 64
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

References:

Glaeser, RM, Nat. Meth. 13 (2016), p. 28.10.1038/nmeth.3695CrossRefGoogle Scholar
Bouchet, D et al. , Physical Review Applied 15 (2021), p. 024047.10.1103/PhysRevApplied.15.024047CrossRefGoogle Scholar
Koppell, S and Kasevich, M, Optica 8 (2021), p. 493.10.1364/OPTICA.412129CrossRefGoogle Scholar
Juffmann, T et al. , Scientific Reports 7 (2017), p. 1699.10.1038/s41598-017-01841-xCrossRefGoogle Scholar
Koppell, SA et al. , Ultramicroscopy 207 (2019), p. 112834.10.1016/j.ultramic.2019.112834CrossRefGoogle Scholar
Marchand, R et al. , Physical Review Applied 16 (2021), p. 12102.10.1103/PhysRevApplied.16.014008CrossRefGoogle Scholar
Geelen, D et al. , Review Letters 123 (2019).10.1103/PhysRevLett.123.086802CrossRefGoogle Scholar
Hohenester, U and Trügler, A, Computer Physics Communications 183 (2012), p. 370.10.1016/j.cpc.2011.09.009CrossRefGoogle Scholar