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Measurements of Absolute X-ray Generation Efficiency

Published online by Cambridge University Press:  01 August 2002

M.Satya Prasad  and
D. C. Joy
M.Satya Prasad
Affiliation:
EM Facility, University of Tennessee, Knoxville, TN 37996-0810
D. C. Joy
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN 37831-6064

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1486 - 1487
Copyright
Copyright © Microscopy Society of America 2002