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Measuring and Quantitatively Analyzing the Electrical Characteristics of Individual Semiconducting Nanowires in an Nanowire Array

Published online by Cambridge University Press:  03 August 2008

L-M Peng ,
Y Liu ,
S Wang ,
ZY Zhang  and
Q Li
L-M Peng
Affiliation:
Peking University, China
Y Liu
Affiliation:
Peking University, China
S Wang
Affiliation:
Peking University, China
ZY Zhang
Affiliation:
Peking University, China
Q Li
Affiliation:
Chinese University of Hong Kong, Hong Kong
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 4 - 5
Copyright
© 2008 Microscopy Society of America

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