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Measuring Charge State at the Single-Atomic-Column-Base with Four-Dimensional Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Wenpei Gao ,
Chris Addiego ,
Huaixun Huyan  and
Xiaoqing Pan
Wenpei Gao
Affiliation:
Department of Materials Science and Engineering, University of California-Irvine, Irvine, CA 92697USA
Chris Addiego
Affiliation:
Department of Physics and Astronomy, University of California-Irvine, Irvine, CA 92697, USA
Huaixun Huyan
Affiliation:
Department of Materials Science and Engineering, University of California-Irvine, Irvine, CA 92697USA
Xiaoqing Pan*
Affiliation:
Department of Materials Science and Engineering, University of California-Irvine, Irvine, CA 92697USA Department of Physics and Astronomy, University of California-Irvine, Irvine, CA 92697, USA Irvine Materials Research Institute, University of California-Irvine, Irvine, CA 92697, USA
*
*Corresponding author: xiaoqing.pan@uci.edu

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 16 - 17
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Wang, A., Li, J., Zhang, T., Nature Reviews Chemistry 2, 65 (2018)Google Scholar
[2]Muller, D. A., Nature Materials 8, 263 (2009)Google Scholar
[3]This work was supported by the Department of Energy (DOE) under Grant DE-SC0014430. TEM experiments was conducted using the facilities in the Irvine Materials Research Institute (IMRI) at the University of California-Irvine.Google Scholar