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Metallographic Preparation of Zn-21Al-2Cu Alloy for Analysis by Electron Backscatter Diffraction (EBSD)

Published online by Cambridge University Press:  31 March 2014

M. G. Rodríguez-Hernández ,
E. E. Martínez-Flores ,
G. Torres-Villaseñor  and
M. Dolores Escalera
M. G. Rodríguez-Hernández*
Affiliation:
Facultad de Ingeniería, Universidad Autónoma de San Luis Potosí, San Luis Potosí, San Luis Potosí, 78290, México
E. E. Martínez-Flores
Affiliation:
Facultad de Ingeniería, Universidad Autónoma de San Luis Potosí, San Luis Potosí, San Luis Potosí, 78290, México
G. Torres-Villaseñor
Affiliation:
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México, D. F., 04519, México
M. Dolores Escalera
Affiliation:
Departamento de Ciencia e Ingeniería de Materiales, Universidad Rey Juan Carlos, Móstoles, Madrid, 28933, España
*
*Corresponding author. mgpergz@hotmail.com
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Abstract

Samples of Zn-21Al-2Cu alloy (Zinalco) that will be heavily deformed were prepared using five different manual mechanical metallographic methods. Samples were analyzed before tensile testing using the orientation imaging microscopy-electron backscatter diffraction (OIM-EBSD) technique. The effect of type and particle size during the final polishing stages for this material were studied in order to identify a method that produces a flat, damage free surface with a roughness of about 50 nm and clean from oxide layers, thereby producing diffraction patterns with high image quality (IQ) and adequate confidence indexes (CI). Our results show that final polishing with alumina and silica, as was previously suggested by other research groups for alloys that are difficult to prepare or alloys with low melting point, are not suitable for manual metallographic preparation of this alloy. Indexes of IQ and CI can be used to evaluate methods of metallographic preparation of samples studied using the OIM-EBSD technique.

Keywords

electron backscatter diffractionorientation imaging microscopyspecimen preparationZn-Al alloyatomic force microscope
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 20 , Issue 4 , August 2014 , pp. 1276 - 1283
Copyright
© Microscopy Society of America 2014 

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