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Modeling Rectangular Cantilevers during Torsion and Deflection for Application to Frictional Force Microscopy

Published online by Cambridge University Press:  22 May 2009

Victor C. Hayden  and
Luc Y. Beaulieu
Victor C. Hayden
Affiliation:
Department of Physics and Physical Oceanography, Memorial University of Newfoundland, St. John's Newfoundland, Canada
Luc Y. Beaulieu*
Affiliation:
Department of Physics and Physical Oceanography, Memorial University of Newfoundland, St. John's Newfoundland, Canada
*
Corresponding author. E-mail: lbeaulieu@mun.ca
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Abstract

A numerical and experimental analysis of the optical beam deflection system used to monitor microcantilevers subjected to simultaneous deflection and twisting such as in lateral or frictional force microscopy was performed. This study focused on two optical beam deflection orientations where in the first case the optical beam and the detector are at a right angle to the length of the cantilever and the second case, which is the more standard orientation, the optical beam is parallel to the length of the lever. This study finds that it is possible to model the twist and the deflection separately and treat each motion independently. Simulations have shown that the above-mentioned systems are equivalent in accuracy and sensitivity for monitoring the simultaneous twist and deflection of cantilevers.

Keywords

frictional force microscopylateral force microscopyatomic force microscopymicrocantileversnumerical modeling
Type
Atomic Force Microscopy
Information
Microscopy and Microanalysis , Volume 15 , Issue 3 , June 2009 , pp. 259 - 264
Copyright
Copyright © Microscopy Society of America 2009

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References

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