Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-29T10:14:33.442Z Has data issue: false hasContentIssue false

Modelling the Radiolysis of Silver Nitrate Solutions in presence of Bromide Ions in Liquid-Phase Transmission Electron Microscopy

Published online by Cambridge University Press:  03 December 2021

Mehran Taherkhani
Affiliation:
Electron Devices (LEB), Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany.
Birk Fritsch
Affiliation:
Electron Devices (LEB), Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany.
Michael P. M. Jank
Affiliation:
Fraunhofer Institute for Integrated Systems and Device Technology IISB, Erlangen, Germany.
Erdmann Spiecker
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), FAU, Erlangen, Germany.
Andreas Hutzler
Affiliation:
Electron Devices (LEB), Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany. Helmholtz Institute Erlangen-Nürnberg for Renewable Energy (IEK-11), Forschungszentrum Jülich GmbH, Erlangen, Germany.

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Posters
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Schneider, N M et al. , J. Phys. Chem. C 118 (2014), p. 22373.10.1021/jp507400nCrossRefGoogle Scholar
Hutzler, A et al. , Nano Lett. 18 (2018), p. 7222.10.1021/acs.nanolett.8b03388CrossRefGoogle Scholar
Hutzler, A et al. , J. Vis. Exp. (2019), Art. No. e59751.Google Scholar
Fritsch, B et al. , Nanoscale Adv. 3 (2021), p. 2466.10.1039/D0NA01027HCrossRefGoogle Scholar
Grogan, J M et al. , Nano Lett. 14 (2014), p. 359.10.1021/nl404169aCrossRefGoogle Scholar
Hutzler, A et al. , Adv. Mater Interfaces 6 (2019), Art. No. 1901027.Google Scholar
Liu, P et al. , Nano Lett. 20 (2020), p. 1944.Google Scholar
Aliyah, K et al. , J. Phys. Chem. Lett. 11 (2020), p. 2830.10.1021/acs.jpclett.0c00121CrossRefGoogle Scholar
Financial support by the German Research Foundation (DFG) via the Cluster of Excellence “Engineering of Advanced Materials (EAM)” as well as the Research Training Group GRK 1896 “In situ microscopy with electrons, X-rays and scanning probes” is gratefully acknowledged.Google Scholar