Hostname: page-component-745bb68f8f-d8cs5 Total loading time: 0 Render date: 2025-01-07T10:54:05.903Z Has data issue: false hasContentIssue false
  • English
  • Français

Modulated Nanostructure Characterization Using Aberration Corrected STEM

Published online by Cambridge University Press:  30 July 2020

Ray Carpenter ,
Ronit Sawant  and
Toshihiro Aoki
Ray Carpenter
Affiliation:
Arizona State University, Mesa, Arizona, United States
Ronit Sawant
Affiliation:
Arizona State University, Tempe, Arizona, United States
Toshihiro Aoki
Affiliation:
University of California - Irvine, Irvine, California, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Electron Microscopy to Characterize Materials Embedded in Devices
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1074 - 1076
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Cahn, J. W. (1962), Acta Met.10, 179–183.10.1016/0001-6160(62)90114-1CrossRefGoogle Scholar
Carpenter, R. W. (1967), Acta Met.15, 1567–1572.10.1016/0001-6160(67)90129-0CrossRefGoogle Scholar
Bentley, J. (1989), Ultramicros.30, 157–171.10.1016/0304-3991(89)90183-6CrossRefGoogle Scholar
Crewe, A. V. et al. (1975), p. 47 in Physical Aspects of Electron Microscopy and Microbeam Analysis, ed. by Siegel, and Beaman, , Wiley, New York.Google Scholar
Krivanek, O. L. et al. (2008), Ultramicros.108, 179–195.10.1016/j.ultramic.2007.07.010CrossRefGoogle Scholar
Wise, A. et al. (2008), App. Phy. Lett. 92, 261914.10.1063/1.2953451CrossRefGoogle Scholar
Treacy, M. M. J. (2011), Micros. Microanal.17, 847–858.10.1017/S1431927611012074CrossRefGoogle Scholar
Hartel, P. et al. (1996), Ultramicros.63, 93–114.10.1016/0304-3991(96)00020-4CrossRefGoogle Scholar