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Multi-modal characterization approach to understand proton transport mechanisms in solid oxide fuel cells

Published online by Cambridge University Press:  05 August 2019

Raymond R. Unocic ,
Jilai Ding ,
Janakiraman Balachandran ,
Xiahan Sang ,
Wei Guo ,
Jonathan D. Poplawsky ,
Gabriel M. Veith ,
Craig A. Bridges ,
Nazanin Bassiri-Gharb  and
Panchapakesan Ganesh
Raymond R. Unocic*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, USA.
Jilai Ding
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, USA. School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta GA, USA.
Janakiraman Balachandran
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, USA.
Xiahan Sang
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, USA.
Wei Guo
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, USA.
Jonathan D. Poplawsky
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, USA.
Gabriel M. Veith
Affiliation:
Chemical Sciences Division, Oak Ridge National Lab, Oak Ridge TN, USA.
Craig A. Bridges
Affiliation:
Chemical Sciences Division, Oak Ridge National Lab, Oak Ridge TN, USA.
Nazanin Bassiri-Gharb
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta GA, USA. G.W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GAUSA.
Panchapakesan Ganesh
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge TN, USA.
*
*Corresponding author: unocicrr@ornl.gov

Abstract

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Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2048 - 2049
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Kreuer, KD, Annual Review of Materials Research 33 (2003), p.333.Google Scholar
[2]Balachandran, J et al. , Journal of Physical Chemistry C 121 (2017), p. 26637.Google Scholar
[3]Ding, J et al. , Chemistry of Materials 30 (2018), p. 4919.Google Scholar
[4]Ding, J et al. , ACS Applied Materials & Interfaces 10 (2018), p. 4816.Google Scholar
[5]Research supported by ORNL's Laboratory Directed Research and Development Program, which is managed by UT-Battelle, LLC for the U.S. Department of Energy (DOE). Electron microscopy was conducted as part of a user proposal at Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), which is a U.S. DOE Office of Science User Facility.Google Scholar