Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-28T01:06:35.858Z Has data issue: false hasContentIssue false
  • English
  • Français

Multislice Electron Scattering Simulations for Angstrom-scale Magnetic Measurements with 4D-STEM

Published online by Cambridge University Press:  30 July 2020

Kayla Nguyen ,
Jeffrey Huang ,
Manohar Karigerasi ,
Kisung Kang ,
Andre Schleife ,
Daniel Shoemaker ,
David Cahill ,
Jian-Min Zuo  and
Pinshane Huang
Kayla Nguyen
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Jeffrey Huang
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Manohar Karigerasi
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Kisung Kang
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Andre Schleife
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Daniel Shoemaker
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
David Cahill
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Jian-Min Zuo
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Pinshane Huang
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 22 - 23
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Boersch, H. et al. , Naturwissenschaften., 46, (1959) 574.10.1007/BF01750912CrossRefGoogle Scholar
Mankos, M. et al. , Advances in Imaging and Electron Physics (1996) 323–426.10.1016/S1076-5670(08)70168-XCrossRefGoogle Scholar
Tanigaki, T. et al. , Microscopy and Microanlysis, 25-S2 (2019) 54–55.10.1017/S1431927619001004CrossRefGoogle Scholar
Chapman, JN. et al. Ultramicroscopy 3, (1978) 203–214.10.1016/S0304-3991(78)80027-8CrossRefGoogle Scholar
Muller, K. et al. Nature Communications 5, (2014) 5653.5651-5656.Google Scholar
McGrouther, D. et al. New Journal of Physics 18, (2016) 1–12.10.1088/1367-2630/18/9/095004CrossRefGoogle Scholar
Shibata, N. et al. , Nature Communications 10, (2019) 1–5.10.1038/s41467-019-10281-2CrossRefGoogle Scholar
Nguyen, KX. et al. ‘Disentangling magnetic and grain contrast in polycrystalline FeGe thin films using 4D-Lorentz Scanning Transmission Electron Microscopy.” arXiv:2001.06900v1Google Scholar
Tate, MW. et al. Microscopy and Microanalysis 22, (2016) 237–249.10.1017/S1431927615015664CrossRefGoogle Scholar
Kirkland, EJ. “Advanced Computing in Electron Microscopy”, ed. 2, (Springer, New York City) p.1.Google Scholar
Katsuraki, H. et al. Journal of Applied Physics 36, (1965) 1094.10.1063/1.1714113CrossRefGoogle Scholar
Yang, K. et al. Physical Review Materials 3, (2019) 124408-1-11.Google Scholar
This work was supported by the NSF-MRSEC program under NSF Award Number DMR-1720633. Experiments were carried out in the Frederick Seitz Materials Research Laboratory at the University of Illinois at Urbana-Champaign.Google Scholar