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My Life With Erwin: The Beginning of an Atom-Probe Legacy

Published online by Cambridge University Press:  25 April 2019

John A. Panitz*
Affiliation:
The University of New Mexico, Department of Physics and Astronomy, MSC074220, 1919 Lomas Blvd NE, 1 University of New Mexico, Albuquerque, NM, 87131-0001
*
Author for correspondence: John A. Panitz, E-mail: panitz@unm.edu
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Abstract

The atom-probe field ion microscope was introduced in 1967 at the 14th Field Emission Symposium held at the National Bureau of Standards (now, NIST) in Gaithersburg, Maryland. The atom-probe field ion microscope was, and remains, the only instrument capable of determining “the nature of one single atom seen on a metal surface and selected from neighboring atoms at the discretion of the observer”. The development of the atom-probe is a story of an instrument that one National Science Foundation (NSF) reviewer called “impossible because single atoms could not be detected”. It is also a story of my life with Erwin Wilhelm Müller as his graduate student in the Field Emission Laboratory at the Pennsylvania State University in the late 1960s and his strong and volatile personality, perhaps fostered by his pedigree as Gustav Hertz’s student in the Berlin of the 1930s. It is the story that has defined by scientific career.

Type
The Erwin W. Müller Memorial Lecture
Copyright
Copyright © Microscopy Society of America 2019 

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References

Castaing, R (1960) Electron probe microanalysis. Adv Electronics Electron Phys 13, 317386.Google Scholar
Müller, EW (1937) Elektronenmikroskopische Beobachtungen von Feldkathoden. Z für Physik 106, 541550.Google Scholar
Müller, EW (1941) Abreissen adsorbierter Ionen durch hohe elektrische Feldstärke. Naturwissenschaften 29, 533536.Google Scholar
Müller, EW (1951) Das Feldionenmikroskop. Z für Physik 131, 136142.Google Scholar
Müller, EW (1956) Resolution of the atomic structure of a metal surface by the field ion microscope. J Appl Phys 27, 474476.Google Scholar
Müller, EWPanitz, J (1967) The atom-probe field ion microscope. In Proceedings of the 14th Field Emission Symposium, 1967. National Bureau of Standards, Washington, DC, 31.Google Scholar
Müller, EW, Panitz, JAMcLane, SB (1968) The atom-probe field ion microscope. Rev Sci Instrum 39, 8386.Google Scholar
Panitz, JA (1969) The atom-probe FIM. PhD Thesis. University Park, PA, 13.Google Scholar
Panitz, JA (1973) The 10-cm atom probe. Rev Sci Instrum 44, 10341038.Google Scholar
Panitz, JA (1974) The crystallographic distribution of field-desorbed species. J Vac Sci Technol A11, 206210.Google Scholar
Seidman, DN (2007) Three-dimensional atom-probe tomography: Advances and applications. Ann Rev Mater Res 37, 127158.Google Scholar
Turner, PJ, Cartwright, P, Southon, MJ, van Oostrom, AManley, BW (1969) Use of a channelled image intensifier in the field-ion microscope. J Phys E Sci Instrum 2(8), 731.Google Scholar
Waugh, AR (1975) Applications of an imaging atom-probe. In Proceedings of the 22nd International Field Emission Symposium. Georgia Institute of Technology, Atlanta, GA, 69.Google Scholar