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A New Approach for 3D Quantitative STEM Using Defocus Corrected Electron Ptychography

Published online by Cambridge University Press:  22 July 2022

Ali Mostaed ,
Emanuela Liberti ,
Chen Huang ,
Angus I. Kirkland  and
Peter Nellist
Ali Mostaed*
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
Emanuela Liberti
Affiliation:
Department of Materials, University of Oxford, Oxford, UK The Rosalind Franklin Institute, Harwell Campus, Didcot, UK
Chen Huang
Affiliation:
Department of Materials, University of Oxford, Oxford, UK The Rosalind Franklin Institute, Harwell Campus, Didcot, UK
Angus I. Kirkland
Affiliation:
Department of Materials, University of Oxford, Oxford, UK The Rosalind Franklin Institute, Harwell Campus, Didcot, UK electron Physical Science Imaging Centre (ePSIC), Diamond Light Source, Didcot, UK
Peter Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
*
*Corresponding author: ali.mostaed@materials.ox.ac.uk

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 380 - 381
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Copyright
Copyright © Microscopy Society of America 2022

References

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AM acknowledge funding from the European Unions Horizon 2020 research and innovation program under Grant No. [823717] – ESTEEM3. The authors thank the Diamond Light Source for access the electron Physical Science Imaging Centre (Instrument E02, Proposal Nos. MG20431and MG22317) that contributed to the results presented here.Google Scholar