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A New Electron-Optical Mode for High Contrast Imaging and Online Stereo Observation in TEM

Published online by Cambridge University Press:  08 August 2003

G.Y. Fan ,
S.J. Young ,
T. Deerinck  and
M.H. Ellisman
G.Y. Fan
Affiliation:
National Center for Microscopy and Imaging Research, Department of Neurosciences, University of California at San Diego, La Jolla, California, 92093-0608
S.J. Young
Affiliation:
National Center for Microscopy and Imaging Research, Department of Neurosciences, University of California at San Diego, La Jolla, California, 92093-0608
T. Deerinck
Affiliation:
National Center for Microscopy and Imaging Research, Department of Neurosciences, University of California at San Diego, La Jolla, California, 92093-0608
M.H. Ellisman
Affiliation:
National Center for Microscopy and Imaging Research, Department of Neurosciences, University of California at San Diego, La Jolla, California, 92093-0608
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Abstract

We describe a new electron-optical configuration for transmission electron microscopy (TEM). In this novel mode, the objective mini-lens is strongly excited so that the back focal plane of the objective lens is imaged onto the plane of the selected-area aperture with a magnification of 3.2. Thus, the selected-area aperture can function as an objective aperture either in place of or in addition to the conventional objective aperture. This new configuration, which has been implemented on a JEOL 4000EX high voltage electron microscope, provides improved resolution and contrast in images of thick biological specimens and also facilitates the use of beam tilt for stereo image acquisition.

Keywords

TEMhigh contrast imagingEELSenergy filteringbeam tiltobjective mini-lens
Type
Research Article
Information
Microscopy and Microanalysis , Volume 2 , Issue 3 , June 1996 , pp. 137 - 146
Copyright
© 1996 Microscopy Society of America

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