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New Image Texture Analysis, and Application to Polymer Membrane Surface Morphologies and Roughness

Published online by Cambridge University Press:  20 September 2018

Clifford S. Todd Open the ORCID record for Clifford S. Todd [Opens in a new window]  and
William A. Heeschen
Clifford S. Todd*
Affiliation:
Analytical Science, Core R&D, The Dow Chemical Company, 1897 Building, Midland, MI 48667, USA
William A. Heeschen
Affiliation:
Analytical Science, Core R&D, The Dow Chemical Company, 1897 Building, Midland, MI 48667, USA
*
Author for correspondence: Clifford S. Todd, E-mail: CTodd2@dow.com
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Abstract

A new method of image texture analysis is presented, based on the mean and standard deviation of gray levels within domains in an image. The calculations are performed recursively on domains of various sizes within the images. These gray level calculations are used as the input matrix for principal component analysis. The technique analyzes the entire image as a whole and is not for image segmentation. The analysis routine operates across all distances, frequencies and directions in the image, and is not computationally burdensome. The method was applied to scanning electron microscope images of reverse osmosis membranes on domains from 23 nm to 3 µm. The texture analysis technique performed well in identifying the surface morphology and, once calibrated, in predicting the surface roughness as measured by atomic force microscopy.

Keywords

texturemembranesmorphologyprincipal componentSEM
Type
Materials Science Applications
Information
Microscopy and Microanalysis , Volume 24 , Issue 5 , October 2018 , pp. 471 - 477
Copyright
© Microscopy Society of America 2018 

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