Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Koelling, Sebastian
Gilbert, Matthieu
Goossens, Jozefien
Hikavyy, Andriy
Richard, Olivier
and
Vandervorst, Wilfried
2009.
High depth resolution analysis of Si/SiGe multilayers with the atom probe.
Applied Physics Letters,
Vol. 95,
Issue. 14,
Koelling, S.
Innocenti, N.
Schulze, A.
Gilbert, M.
Kambham, A. K.
and
Vandervorst, W.
2011.
In-situ observation of non-hemispherical tip shape formation during laser-assisted atom probe tomography.
Journal of Applied Physics,
Vol. 109,
Issue. 10,
Kambham, A.K.
Mody, J.
Gilbert, M.
Koelling, S.
and
Vandervorst, W.
2011.
Atom-probe for FinFET dopant characterization.
Ultramicroscopy,
Vol. 111,
Issue. 6,
p.
535.
Kambham, Ajay Kumar
Kumar, Arul
Florakis, Antonios
and
Vandervorst, Wilfried
2013.
Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomography.
Nanotechnology,
Vol. 24,
Issue. 27,
p.
275705.
Koelling, S.
Innocenti, N.
Bogdanowicz, J.
and
Vandervorst, W.
2013.
Optimal laser positioning for laser-assisted atom probe tomography.
Ultramicroscopy,
Vol. 132,
Issue. ,
p.
70.
Chiaramonti, Ann N.
Miaja-Avila, Luis
Caplins, Benjamin W.
Blanchard, Paul T.
Diercks, David R.
Gorman, Brian P.
and
Sanford, Norman A.
2020.
Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light.
Microscopy and Microanalysis,
Vol. 26,
Issue. 2,
p.
258.
Lukyanchuk, A. A.
Aleev, A. A.
Shutov, A. S.
Raznitsyn, O. A.
Kirillov, C. E.
and
Rogozhkin, S. V.
2021.
Atom Probe Tomography Data Reconstruction with the Correction on Material Density.
Physics of Atomic Nuclei,
Vol. 84,
Issue. 11,
p.
1836.
Stender, Patrick
Solodenko, Helena
Weigel, Andreas
Balla, Irdi
Schwarz, Tim Maximilian
Ott, Jonas
Roussell, Manuel
Joshi, Yug
Duran, Rüya
Al-Shakran, Mohammad
Jacob, Timo
and
Schmitz, Guido
2022.
A Modular Atom Probe Concept: Design, Operational Aspects, and Performance of an Integrated APT-FIB/SEM Solution.
Microscopy and Microanalysis,
Vol. 28,
Issue. 4,
p.
1168.
Caplins, Benjamin W.
Chiaramonti, Ann N.
Garcia, Jacob M.
Sanford, Norman A.
and
Miaja-Avila, Luis
2023.
Atom probe tomography using an extreme ultraviolet trigger pulse.
Review of Scientific Instruments,
Vol. 94,
Issue. 9,