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New Technique for Ultra-thin Serial Brain Section Imaging Using Scanning Electron Microscopy

Published online by Cambridge University Press:  05 August 2007

N Kasthuri ,
K Hayworth ,
J Lichtman ,
N Erdman  and
CA Ackerley
N Kasthuri
Affiliation:
Harvard Univeristy
K Hayworth
Affiliation:
University of Southern California
J Lichtman
Affiliation:
Harvard University
N Erdman
Affiliation:
JEOL
CA Ackerley
Affiliation:
Hospital for Sick Children
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 26 - 27
Copyright
© 2007 Microscopy Society of America

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