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Non-Destructive Isosurface 3-D Modeling by Scanning Electron Tomography

Published online by Cambridge University Press:  31 July 2006

TS Yeoh  and
NA Ives
TS Yeoh
Affiliation:
The Aerospace Corporation
NA Ives
Affiliation:
The Aerospace Corporation

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1558 - 1559
Copyright
© 2006 Microscopy Society of America