Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2025-01-04T02:10:47.507Z Has data issue: false hasContentIssue false
  • English
  • Français

Non-Empirical Identification of Trigger Sites in Image Data using Persistent Homology: Crack Formation during Heterogeneous Reduction of Iron-Ore Sinters

Published online by Cambridge University Press:  10 August 2018

M. Kimura ,
I. Obayashi ,
Y. Takeichi ,
R. Murao  and
Y. Hiraoka
M. Kimura*
Affiliation:
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, Tsukuba, Japan Department of Materials Structure Science, School of High Energy Accelerator Science, SOKENDAI (The Graduate University for Advanced Studies), Tsukuba, Japan
I. Obayashi
Affiliation:
Advanced Institute for Materials Research (AIMR), Tohoku University, Sendai, Japan
Y. Takeichi
Affiliation:
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, Tsukuba, Japan Department of Materials Structure Science, School of High Energy Accelerator Science, SOKENDAI (The Graduate University for Advanced Studies), Tsukuba, Japan
R. Murao
Affiliation:
Advanced Technology Research Laboratories, Nippon Steel and Sumitomo Metal Corp., Futtsu, Japan
Y. Hiraoka
Affiliation:
Advanced Institute for Materials Research (AIMR), Tohoku University, Sendai, Japan
*
* Corresponding author, email_masao.kimura@kek.jp

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 540 - 541
Copyright
© Microscopy Society of America 2018 

References

[1] Kimura, M, et al, Scientific Reports 8 2018 3553.Google Scholar
[2] Obayashi, I, et al, J. App. and Comp. Topology 2018) (accepted) (doi.org/ 10.1007/s41468-018-0013-5.Google Scholar
[3] Kimura, M, et al, Journal of Physics: Conference Series 849 2017 012015.Google Scholar