Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-14T06:34:17.634Z Has data issue: false hasContentIssue false

A Novel Way for Determining Bravais Lattice Using a Single Electron Backscatter Diffraction Pattern

Published online by Cambridge University Press:  23 September 2015

Lili Li
Affiliation:
School of Materials Science and Engineering, Fujian University of Technology, Fuzhou, 350118, China
Ming Han
Affiliation:
School of Materials Science and Engineering, Fujian University of Technology, Fuzhou, 350118, China

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Dingley, D & Wright, S, J. Appl. Cryst. 42 (2009). p. 234241.Google Scholar
[2] Baba-kishi, K, Scanning 20 (1998). p. 117127.CrossRefGoogle Scholar