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Observation and Theoretical Prediction of Structure in Amorphous Carbon and Related Materials

Published online by Cambridge University Press:  02 July 2020

D.R. McKenzie ,
D.G. McCulloch ,
C.M. Goringe  and
A.R. Merchant
D.R. McKenzie
Affiliation:
School of Physics, University of Sydney, NSW, 2006 Australia. Key Centre for Microscopy and Microanalysis, University of Sydney, NSW, 2006, Australia.
D.G. McCulloch
Affiliation:
Key Centre for Microscopy and Microanalysis, University of Sydney, NSW, 2006, Australia.
C.M. Goringe
Affiliation:
Key Centre for Microscopy and Microanalysis, University of Sydney, NSW, 2006, Australia.
A.R. Merchant
Affiliation:
School of Physics, University of Sydney, NSW, 2006 Australia. Key Centre for Microscopy and Microanalysis, University of Sydney, NSW, 2006, Australia.
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Extract

Covalently bonded materials of the light elements B, C, N, O and Al form an interesting series of structures which are readily prepared by physical vapour deposition methods. The most important structural issues are the degree of positional order (that is, whether the material is amorphous or nano phase crystalline) and for alloys, the degree of site occupancy order (that is, the extent of ‘chemical’ order). We propose that the degree of positional order is dependent on the bond angle stiffness of the covalent bonding and the degree of chemical order is dependent on the energy difference of bonds between like and unlike atoms (see figure 1).

The observation of structure in these materials is conveniently carried out by electron optical techniques in an electron microscope. The techniques of value are (a) Energy Filtered Electron Diffraction, and (b) Electron Energy Loss Spectroscopy (EELS).

Type
Nanophase and Amorphous Materials
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 696 - 697
Copyright
Copyright © Microscopy Society of America

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References

[1] Car, R. and Parrinello, M., Phys. Rev. Lett., 55, 2471 (1985).CrossRefGoogle Scholar

[2] Marks, N.A., McKenzie, D.R., Pailthorpe, B.A.,Bernasconi, M., and Parrinello, M., Phys. Rev. Lett., 76, 768 (1996).CrossRefGoogle Scholar