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Observation of Dislocation-Assisted 2-Dimensional Conductive Channels Embedded in Perovskite Thin Films

Published online by Cambridge University Press:  05 August 2019

Huaixun Huyan ,
Linze Li ,
Yi Zhang ,
Colin Heikes ,
Darrel Schlom  and
Xiaoqing Pan
Huaixun Huyan
Affiliation:
Department of Materials Science and Engineering, University of California – Irvine, Irvine, CA, USA.
Linze Li
Affiliation:
Department of Materials Science and Engineering, University of California – Irvine, Irvine, CA, USA.
Yi Zhang
Affiliation:
Department of Materials Science and Engineering, University of California – Irvine, Irvine, CA, USA.
Colin Heikes
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA.
Darrel Schlom
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA.
Xiaoqing Pan*
Affiliation:
Department of Materials Science and Engineering, University of California – Irvine, Irvine, CA, USA. Irvine Materials Research Institute, University of California – Irvine, Irvine, CA, USA. Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA.
*
*Corresponding author: xiaoqingp@uci.edu

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2410 - 2411
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Nakamura, A et al. , Nature Materials 2 (2003), p. 453.Google Scholar
[2]Zhou, W et al. , Science Advances 4 (3) (2018), p. eaap9096.Google Scholar
[3]Han, Y et al. , Nature Materials 17 (2017), p. 129.Google Scholar
[4]This work was supported by the Department of Energy (DOE) under Grant DE-SC0014430. TEM experiments were conducted using the facilities in the Irvine Materials Research Institute (IMRI) at the University of California-IrvineGoogle Scholar