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Observation of Fine Distribution of Minor Dopants in an Erbium-Doped Fiber Core using a Sample Thinning Technique for Field Emission Electron Probe Microanalysis

Published online by Cambridge University Press:  17 November 2015

Yugo Kubo  and
Koji Kuramochi
Yugo Kubo*
Affiliation:
Analysis Technology Research Center, Sumitomo Electric Industries, Ltd. 1–1–3, Shimaya, Konohana–ku Osaka–shi, Osaka 554–0024, Japan
Koji Kuramochi
Affiliation:
Analysis Technology Research Center, Sumitomo Electric Industries, Ltd. 1–1–3, Shimaya, Konohana–ku Osaka–shi, Osaka 554–0024, Japan
*
*Corresponding author. kubo-yugo@sei.co.jp
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Abstract

To observe the fine distribution of minor aluminum and germanium dopants in the erbium-doped fiber (EDF) core of an optical amplifier, a sample thinning technique was applied for field emission electron probe microanalysis (FE-EPMA) together with wavelength-dispersive X-ray spectrometry. This technique significantly improved the spatial resolution without much degradation of the minimum detection limit for FE-EPMA. As such, this enabled us to observe the distribution of minor dopants in EDF. Moreover, we propose a very simple sample preparation to prevent electron-beam radiation damage, a problem involved with FE-EPMA of low-conductivity materials such as SiO2 glass, which is the main component of EDF.

Keywords

erbium-doped fibersample thinning techniquefield emission electron probe microanalysisminor dopants
Type
Materials Applications and Techniques
Information
Microscopy and Microanalysis , Volume 21 , Issue 6 , December 2015 , pp. 1398 - 1405
Copyright
© Microscopy Society of America 2015 

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