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Observation of Rectifying and Ohmic Grain Boundaries in Polycrystalline BaTiO3 Capacitors with STEM EBIC

Published online by Cambridge University Press:  30 July 2020

William Hubbard ,
Zachary Lingley ,
Miles Brodie  and
Brendan Foran
William Hubbard
Affiliation:
The Aerospace Corporation, El Segundo, California, United States
Zachary Lingley
Affiliation:
The Aerospace Corporation, El Segundo, California, United States
Miles Brodie
Affiliation:
The Aerospace Corporation, El Segundo, California, United States
Brendan Foran
Affiliation:
The Aerospace Corporation, El Segundo, California, United States

Abstract

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Type
Advances in Electron Microscopy to Characterize Materials Embedded in Devices
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 374 - 375
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Copyright
Copyright © Microscopy Society of America 2020

References

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