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Operando and in situ in a TEM imaging in a cryogenic temperature range

Published online by Cambridge University Press:  30 July 2021

Martial Duchamp ,
Joseph Vas ,
Reinis Ignatans ,
Aaron David Mueller ,
Rohit Medwal ,
Rajdeep Rawat  and
Vasiliki Tileli
Martial Duchamp
Affiliation:
Nanyang Technological University (NTU), United States
Joseph Vas
Affiliation:
Nanyang Technological University (NTU), Singapore, Singapore
Reinis Ignatans
Affiliation:
Institute of Materials, École Polytechnique Fédérale de Lausanne, United States
Aaron David Mueller
Affiliation:
Nanyang Technological University (NTU), Singapore, Singapore
Rohit Medwal
Affiliation:
Nanyang Technological University (NTU), Singapore, Singapore
Rajdeep Rawat
Affiliation:
Nanyang Technological University (NTU), Singapore, Singapore
Vasiliki Tileli
Affiliation:
Institute of Materials, École polytechnique fédérale de Lausanne, Lausanne, Switzerland

Abstract

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Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 386 - 387
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Duchamp, M.; Xu, Q.; Dunin-Borkowski, R. E. Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope. Microscopy and Microanalysis. 2014, 20 (06), 1638–1645.CrossRefGoogle ScholarPubMed
Jeangros, Q.; Duchamp, M.; Werner, J.; Kruth, M.; Dunin-Borkowski, R. E.; Niesen, B.; Ballif, C.; Hessler-Wyser, A. In Situ TEM Analysis of Organic–Inorganic Metal-Halide Perovskite Solar Cells under Electrical Bias. Nano Letters. 2016, 16 (11), 7013–7018.CrossRefGoogle ScholarPubMed
Tyukalova, E.; Duchamp, M. Atomic Resolution Enabled STEM Imaging of Nanocrystals at Cryogenic Temperature. J. Phys. Mater. 2020, 3 (3), 034006.CrossRefGoogle Scholar
Ignatans, R.; Damjanovic, D.; Tileli, V. Local Hard and Soft Pinning of 180° Domain Walls in BaTiO3 Probed by in Situ Transmission Electron Microscopy. Phys. Rev. Materials. 2020, 4 (10), 104403.CrossRefGoogle Scholar
Ignatans, R.; Damjanovic, D.; Tileli, V. Local Hard and Soft Pinning of 180° Domain Walls in BaTiO3 Probed by in Situ Transmission Electron Microscopy. Phys. Rev. Materials. 2020, 4 (10), 104403.CrossRefGoogle Scholar
Medwal, R.; Chaudhuri, U.; Vas, J. V.; Deka, A.; Gupta, S.; Duchamp, M.; Asada, H.; Fukuma, Y.; Mahendiran, R.; Rawat, R. S. Magnetoimpedance of Epitaxial Y 3 Fe 5 O 12 (001) Thin Film in Low-Frequency Regime. ACS Appl. Mater. Interfaces. 2020, 12 (37), 41802–41809.CrossRefGoogle Scholar