Hostname: page-component-5f745c7db-8qdnt Total loading time: 0 Render date: 2025-01-06T15:09:17.601Z Has data issue: true hasContentIssue false
  • English
  • Français

Operando Scanning Electron and Microwave Microscopies in Plasmas: A Comparative Analysis

Published online by Cambridge University Press:  30 July 2020

Andrei Kolmakov  and
Alexander Tselev
Andrei Kolmakov
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland, United States
Alexander Tselev
Affiliation:
Department of Physics & CICECO–Aveiro Institute of Materials/ University of Aveiro, Aveiro, Aveiro, Portugal

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Probe Microscopy and Nanomechanics
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2498 - 2499
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Tselev, A., Fagan, J., and Kolmakov, A., “In-situ near-field probe microscopy of plasma processing,” Applied Physics Letters, vol. 113, no. 26, p. 263101, 2018.10.1063/1.5049592CrossRefGoogle Scholar