Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-29T05:17:34.360Z Has data issue: false hasContentIssue false
  • English
  • Français

The Optimization of EDX Performance in Tecnai TEMs

Published online by Cambridge University Press:  01 August 2002

H.S. von Harrach ,
B. Freitag ,
W. Gerits ,
E. van Cappellen  and
A. Sandborg
H.S. von Harrach
Affiliation:
FEI Electron Optics, P.O. Box 218, 5600KE Eindhoven, The Netherlands
B. Freitag
Affiliation:
FEI Electron Optics, P.O. Box 218, 5600KE Eindhoven, The Netherlands
W. Gerits
Affiliation:
FEI Electron Optics, P.O. Box 218, 5600KE Eindhoven, The Netherlands
E. van Cappellen
Affiliation:
FEI Electron Optics, P.O. Box 218, 5600KE Eindhoven, The Netherlands
A. Sandborg
Affiliation:
Edax Inc, 91 McKee Drive, Mahwah, NJ 07430 USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1612 - 1613
Copyright
Copyright © Microscopy Society of America 2002