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Optimizing Reflector Selection for Indexing of EBSD Patterns via Dynamic Pattern Simulation

Published online by Cambridge University Press:  05 August 2019

Stuart I. Wright ,
Marc De Graef  and
Saransh Singh
Stuart I. Wright*
Affiliation:
EDAX, St George UT, USA
Marc De Graef
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA, USA
Saransh Singh
Affiliation:
Lawrence Livermore National Laboratory, Livermore CA, USA
*
*Corresponding author: stuart.wright@ametek.com

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 206 - 207
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Wright, SI, Singh, S, De Graef, M, Microsc. Microanal., (submitted, 2019).Google Scholar
[2]Day, AP, J. of Microscopy 230 (2007), p. 472.Google Scholar
[3]Wright, SI, Adams, BL, Metall. Mater. Trans. A 23 (1992), p. 759Google Scholar
[4]Singh, S, De Graef, M, Model. Simul. Mater. Sc. 24 (2016), p. 085013.Google Scholar
[4]We acknowledge GS Rohrer of CMU for supplying the Rutile sample and R Witt of EBSD Analytical for collecting the EBSD data. MDG and SS acknowledge an ONR Vannevar Bush Faculty Fellowship (N00014-16-1-2821), and the computational resources of the Materials Characterization Facility at CMU, grant MCF-677785. The work of SS was performed partially under the auspices of the U.S. Department of Energy at Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344 (LLNL-JRNL-XXXXXX)Google Scholar