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Oxide Structures: By Hook Or by Crook

Published online by Cambridge University Press:  02 July 2020

L. D. Marks ,
W. Sinkler  and
H. Zhang
L. D. Marks
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL60208
W. Sinkler
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL60208
H. Zhang
Affiliation:
Department of Materials Science and Engineering, Northwestern University, Evanston, IL60208
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Extract

Sometimes oxides are friendly; x-ray or neutron diffraction solves the structure and (at most) simple HREM does a double check. Sometimes they are not. Problems can range from phase purity (identifiable using EDX) to more subtle issues about the true unit cell and/or atom locations. The latter are often particularaly hard for x-ray or neutron to handle when single crystal data is not available and, for instance, the samples are polyphase or textured.

One common problem is that the unit cell is rather larger than originally thought due to a superstructure. While superstructure reflections may be obvious in the microscope due to the very large dynamic range of TED patterns, they may not show in powder patterns. The issue then is to determine the true structure using (often) a combination of HREM and TED plus multislice simulations to confirm the structure.

Type
Microscopy of Semiconducting and Superconducting Materials
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 678 - 679
Copyright
Copyright © Microscopy Society of America

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References

References:

1)Chmaissem, O., Argyriou, D. N., Hinks, D. G., Jorgensen, J. D., Storey, B. G., Zhang, H., Marks, L. D., Wang, Y. Y., Dravid, V. P. and Dabrowski, B., Phys. Rev. B 52, 15636 (1995).CrossRefGoogle Scholar
2)Sinkler, W.,Bengu, E. and Marks, L. D., Acta Ctyst. A, in press (1998).Google Scholar